2005.12 Founded.

2005.12 Test engineering consultant of probe card vendor (MPI)

2006.02 Take contract of training center instructors No.1 ATE vendor

2006.06 Testing Design of critical mixed SiIP for No.1 Design Service

2006.08 Contract with Test Houses for ATE platform conversion and optimization

2006.09 Testing Design for LCD TV controller chip for TV maker

2007.02 Distributor and Engineering Service for pattern conversion tool

2007.02 Start business of Sustaining support for Fabless and Design Service

2007.05 Testing design of Embedded memory for No.1 foundry

2007.07 RFIC program development for North America Fabless

2007.07 Testing Design of Satellite Chipset for No.1 Foundry and China Fabless

2007.11 Test program development for over 100 design houses.

2008.02 ATE platform conversion for fabless in North America

2008.04 Characterization project for fabless in North America