| VLSI testing and ATE overview： |
| Object ： |
To have a basic understanding for VLSI testing from introducing VLSI characteristic, measurement theory and ATE platform structures. |
| Syllabus： |
1. |
Philosophy of VLSI Testing |
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2. |
ATE and Testing Principle |
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3. |
Device and Device Testing |
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4. |
Specification and Testing |
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5. |
Design For Testability (option) |
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| Class hours： 12 hours |
