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  > Probe card technology
 

> Close-loop EDA-linked testing pattern

 

Probe card technology:
Object :

To introduce probe-card knowledge and theory, including probe-card structure, characteristic, application, measurement and analysis.

Syllabus: 1. Probe Card Overview (Logic, LCD Driver, Memory)
  2. Cantilever Probe Card
  3. Advanced Probe Card
  4. Probe Card Measurement & Analysis
  5. Probe Card Challenges  
Class hours: 6 hours

 

 

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