Back End Service Technology Integration Inc.

Institutes
Training courses
	> VLSI testing and ATE overview
	> VLSI testing and application
	> LCD driver IC theory and testing
	> Mixed signal testing and DSP
	> Mixed signal test theory & application
	> High speed differential bus introduction & testing
	> Micro-wave theory and RF IC testing
	> SDRAM testing
	> Load board technology
	> Probe card technology
	> Close-loop EDA-linked testing pattern

Close-loop EDA-linked testing pattern：
Object ：	To have a basic understanding for VLSI testing from introducing VLSI characteristic, measurement theory and ATE platform structures.
Syllabus：	1.	Design flow/Tool introduce
	2.	Testing pattern data format introducing
	3.	How to link design to testing

Class hours： 6 hours

@2008-2010 Back End Service Technology Integration Inc.
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