Back End Service Technology Integration Inc.

Institutes
Training courses
	> VLSI testing and ATE overview
	> VLSI testing and application
	> LCD driver IC theory and testing
	> Mixed signal testing and DSP
	> Mixed signal test theory & application
	> High speed differential bus introduction & testing
	> Micro-wave theory and RF IC testing
	> SDRAM testing
	> Load board technology
	> Probe card technology
	> Close-loop EDA-linked testing pattern

VLSI testing and application：
Object ：	To understand testing theory, ATE platform, testing items, test methods, test programs, test patterns, operation environment and test flow.
Syllabus：	1.	DC Parametric Testing
	2.	Functional Testing
	3.	AC Parametric Testing
	4.	Characterization Test
	5.	Test Pattern Development
	6.	Test Program Development (option)
Class hours： 12 hours

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