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| SDRAM testing： |
| Object ： |
Object:Understand SDRAM testing, ATE and applications. |
| Syllabus： |
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Introduction to SDRAM-- High Speed DRAM-- DRAM and SDRAM operations-- Features of SDRAM-- Basic Operations -- Device Pins-- External View of Device |
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2. |
Functional Test-- Measurement Conditions-- Main Program- - Pattern Program-- Comparison for CAS Latency-- Acquisition of Failure Data3. Power Current Measurement-- ICC1-- ICC2P, ICC2N-- ICC3P, ICC3N-- ICC4, ICC5, ICC6 |
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| Class hours： 6 hours |
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