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IC testing is a complicated and integration technology. It is related to device/wafer, ATE/handler/prober, test program, probe-card, load-board, socket and docking mechanism. |
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Our engineers are all specialists in this field and provide professional and fast consultant service to fix trouble as soon as possible.
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Test Solution / Platform Selection. |
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ETS Documentation Service. |
3.) |
ATE Test Philosophy and Strategy. |
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Pattern processing. |
5.) |
Design Testability / Biult-In Self Test. |
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